FT/IR-4100 FT/IR-4200 Microscope
FTIR4000 Series FT/IR-4000 Series purge design N2gas inlet
Control valve Instrument purge is standard for all models of the FT/IR-4000 Series.
FTIR4000 Series Purge System Conventional method
Find the zero crossings, then interpolate a matching set of IR data points.
Over sampling method
Reduction of high frequency noise by over sampling with a 16 times greater number of sampling points enables improvement of the S/N ratio.
Pre-amp.
Analog circuit
Photo coupler
Voice Coil
HeNe laser
Photo coupler
Pre-amp.
ADC
DSP
DAC
Clock
24-bit AD
Voice Coil
HeNe laser
Accurate mirror drive
And reduce flutter at low wavenumber range.
FT/IR-4000 & 6000 series
S/N ratio (Oversampling system) FT/IR-6100 / 6200 / 6300 FT/IR-600Plus Polymer shell
Improved instrument design
Compact size
- Upgradeability
- Wide wavenumber range
- Full vacuum capability
- Step scan upgrade
Microscope
FT-Raman
FT/IR-6000 Series Optical design FTIR6000 Series FT/IR-6000 Series purge design N2gas inlet
Purge control valve – front side Instrument purge is standard for all models of the FT/IR-6000 Series.
FTIR6000 Series Purge/Vacuum System
