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Schematic diagram of a
SHRIMP
instrument illustrating the ion beam path. After Figure 4, Williams, 1998.
[9]
grain in order to yield a secondary beam
of Pb ions. The Pb ions are analyzed
using a double focusing mass
spectrometer that comprises both an
electrostatic and magnetic analyzer. This
assembly allows the secondary ions to
be focused based on their kinetic energy
and mass-charge ratio in order to be
accurately collected using a series of
Faraday cups.
[10]
A major issue that arises in SIMS
analysis is the generation of isobaric
interference between sputtered
molecular ions and the ions of interest.
This issue occurs with U–Pb dating as
Pb ions have essentially the same mass
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