1. Introduction The titanium oxide is a typical n-type semiconductor. It has three crystalline forms found in nature: brookite, anatase



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Nanocrystalline TiO2 Powder Prepare

2. materials and methodology
The purpose of the experiment was the preparation of 
the nanocrystalline titanium dioxide powder by using a sol-
gel method and research confirmation of its morphology 
and structure. For comparison purposes, a commercially 
available titanium dioxide powder (i.e. titanium white) was 
also used. nanopowder was synthesized by using titanium 
tetra isopropoxide (TTiP) as a precursor. first has prepared 
a solution consisting of tetra isopropoxide and isopropanol by 
mixing using a magnetic stirrer. At the same time, the acidic 
solution of distilled water was prepared, which is a catalyst for 
the precipitation of the powder. By varying the amount of nitric 
acid, the ph of the solution was changed. These solutions were 
mixed with a magnetic stirrer at temp. 60÷70°C for 20 hours. To 
evaporate the rest of water, the calcination process was carried 
out, by heating the chemical compound below its melting 
point. Then, the titanium dioxide thin films from as prepared 
nanopowder and commercial powder were deposited on an ITO 
glass substrate by using a doctor blade technique.
The high-resolution transmission electron microscope 
s/TeM Titan 80-300 fei company was used to confirm that 
the as-prepared powder is nanocrystalline. Observations were 
carried out with energy 300 kv in the classical model (TeM) 
and in the beam surface-scanning mode (sTeM). for this 
purpose, prepared powder was deposited on the special copper 
mesh preparations used in electron microscopy. The structure 
of titanium oxide was investigated by X-ray crystallography. 
A variety of crystalline TiO
2
was also confirmed by using the 
Raman spectrometer. The TiO
2
thin films have been examined by 
using an evolution 220 uv-vis spectrometer Thermo scientific 
company. The study of surface morphology of commercial TiO
2
powder was performed by using a scanning electron microscope 
Zeiss Supra 35. The accelerating voltage was 1 kV. To obtain 
images of the surface topography, the detection of secondary 
electrons (by the detector In Lens) was used.

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