Table 2 . Mix proportion of the materials
S/NO Mix ID Materials (gm) PC RHA CCW MK Group 1a
100 % PC
300
-
-
-
Group 1b, BM
95PC- 5MK
285
-
-
15
90PC- 10MK
270
-
-
30
80PC- 20MK
240
-
-
60
Group 2, BM
95PC- 5RHA
285
15
-
-
90PC- 10RHA
270
30
-
-
80PC- 20RHA
240
60
-
-
Group 3, BM
95PC- 5CCW
285
-
15
-
90PC- 10CCW
270
-
30
-
80PC- 20CCW
240
-
60
-
Group 4, TM
95PC- 5CCW-5MK
285
-
15
15
90PC- 10CCW-10MK
270
-
15
15
80PC- 20CCW-20MK
240
-
30
30
Group 5, QM
95PC-5CCW-5RHA-5MK
255
15
15
15
90PC-10CCW-10RHA-10MK 210
30
30
30
80PC-20CCW-20RHA-20MK 120
60
60
60
BM, binary mix; TM, ternary mix; QM, quaternary mix; PC, Portland cement
Figure 1. Consistency of PC-CCW-RHA-MK
0
20
40
60
0
10
20
30
No rm al Co nsistency % Replacement level of PC with CCW-RHA- MK binder pc-ccw-rha-
mk
Nanotechnology Applications in Africa: Opportunities and Constraints
IOP Conf. Series: Materials Science and Engineering 805 (2020) 012031
IOP Publishing
doi:10.1088/1757-899X/805/1/012031
9
3.2.2 The initial and final setting times of PC-CCW-RHA-MK binders For quaternary binders containing PC, CCW, RHA and MK, the setting times, initial (IS) and
final (FS) are shown in Figures 2 and 3. It can be observed that the effect of the admixtures
prolonged the setting times of the quaternary binders when compared with control value. The
observed retardation in setting times is mainly due to the effect of lower cement content. It can
also be observed that the setting times for binary and ternary binders increased as percentage
replacement level of PC with the admixtures increased. This shows that the admixtures used in
this study retards the setting times of binary, ternary and quaternary binders [36, 37]. If
quaternary binder (PC-CCW-RHA-MK) is compared with ternary binder (PC-CCW-MK),
(Table 3 and Figure 3) at 5 % replacement level, IS decreased by 27 %, at 10 % replacement
level, increased by 8 % and then decreased again at 20 % replacement level by 24 %.
Figure 2 . Initial setting times of binders
Figure 3 . Final setting times of binders
0
50
100
150
200
0
10
20
30
Initial setting time % REPLACEMENT LEVEL OF PC PC-CCW-RHA-
MK
PC-CCW
PC-RHA
PC-MK
0
50
100
150
200
250
300
350
0
10
20
30
Fi nal setting ttime % Replacement Level of PC PC-CCW-RHA-
MK
PC-CCW-MK
PC-CCW
PC-RHA
PC-MK
Nanotechnology Applications in Africa: Opportunities and Constraints
IOP Conf. Series: Materials Science and Engineering 805 (2020) 012031
IOP Publishing
doi:10.1088/1757-899X/805/1/012031
10