Thus, based on the rules of generalized moments of atoms and molecules of elementary semiconductors and binary compounds III-V, the possibility of forming a semiconductor solid solution of molecular substitution based on silicon and gallium nitride has been estimated. Solid solutions of molecular substitution (Si2)1-x(GaN)x on silicon substrates have been grown by liquid-phase epitaxy from a limited volume of a tin solution-melt. The epitaxial layers had a mirror-smooth surface with the high-quality adhesive properties to the substrate.
The grown layers (Si2)1-x(GaN)x have a number of interesting properties, in particular, layers of pure GaN could be grown on them; atoms of Si2 molecules form a band of energy levels are lying at 1.66 eV below the bottom of the conduction band of solid solutions; and current transfer in the p-Si–n-(Si2)1-x(GaN)x structure is stable in the temperature range from 300 to 360 K.
ACKNOWLEDGMENT
This work was financially supported by the Fundamental Research Programs of the Uzbekistan Academy of Sciences on the topic “Photovoltaic, thermal-voltaic, photothermal-voltaic and radiative effects in two and multicomponent semiconductor solid solutions with nanocrystals, created on silicon substrates from the liquid phase”.
DATA AVAILABILITY
The data supporting the findings of this study are available from corresponding author by request.
REFERENCES
Epitaxial Wafer Market: Global Industry Trends, Share, Size, Growth, Opportunity and Forecast 2022-2027. DUBLIN, April 28, 2022. ID: 5602889 Report Region: Global 92 Pages. 2022.
Robert Foster Davis, S. M. Bishop,S. Mita, Z. Sitar. “Epitaxial Growth Of Gallium Nitride . Surface and Interface Science: Solid-Solid Interfaces and Thin Films”. First Edition. Wiley-VCH Verlag GmbH & Co. KGaA. Published by Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Kevin Linthicum, T. Gehrke, D. Thomson, Robert Foster Davis. “Pendeo-Epitaxial Growth of GaN on SiC and Silicon Substrates via Metalorganic Chemical Vapor Deposition”. Materials Research Society symposia proceedings. Materials Research Society 572. 2011.
A.S. Saidov, M.S. Saidov, E.A. Koshchanov “Liquid epitaxy of compensated layers of Gallium Arsenide and solid solutions based on it”. Tashkent, ed. "Fan", 128 p., 1986.
Adirovich E.I., Karageorgy-Alkalaev P.M., Leyderman A.Yu. “Double injection currents in semiconductors”. M., Sov. Radio, 320 p. 1978.
A.S. Achilov, Sh.A. Mirsagatov. “Temperature dependence of the reverse branch of the CVC of the Al-p-CdTe-Mo structure”. Physical engineering of the surface. - Vol. 13, No. 3. - pp. 298-312, 2015.
Karageorgy-Alkalaev P.M., Leiderman A.Yu. Photosensitivity of semiconductor structures with deep impurities. Tashkent, ed. "Fan", 200 p., 1981.