2
defined rectifying behavior with a superior rectification ratio of 10
5
at
5 V and a relatively
small ideality factor of
n = 1.9 with lower reverse leakage current and series resistance at
room temperature in dark condition. Moreover, an open circuit voltage
of 120 mV is also
observed under illumination. Based on spectral photoresponsivity measurements, the
nanowire based device exhibits a distinct responsivity (0.35
0.5 A W
−1
) and high detectivity
(6 x 10
12
9 x 10
12
cm Hz
1/2
W
−1
) in near-infrared wavelength region. The enhanced device
performance and photosensitivity is believed to be due to three-dimensional nature of the
interface between the CdTe thin film and the Si nanowires. The device characteristics
observed here reveals that fabricated CdTe thin film/Si nanowire heterojunctions are
promising for high-performance and low-cost optoelectronic device applications, near-
infrared photodedectors in particular.
Keywords: A. heterojunctions, A. nanostructured materials, A. semiconductors, B.
nanofabrications
*
Corresponding authors
: fundaaksoy01@gmail.com, Tel: +90 (388) 225 42 17, Fax: +90 (388) 225 01 80
guvencakgul@gmail.com, Tel: +90 (388) 311 45 27, Fax: +90 (388) 311 84 37
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